Inproceedings: An article in a conference proceedings.
Off-axis low-coherence interferometry for surface topology measurement.
Title of the conference
Speckle 2010: Optical Metrology
Florianopolis, Brazil, September, 13-15, 2010
In this communication we introduce a low or reduced coherence interferometry technique that can be used to retrieve surface topology on samples with high roughness. Moreover, we will show that the approach enables surface topology measurement also at the interface of so-called turbid media, where multiple scattering inside tissues can be a major issue, preventing accurate measurements.
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