Robust image alignment for cryogenic transmission electron microscopy.
Details
Serval ID
serval:BIB_9F9A3B9CBBBF
Type
Article: article from journal or magazin.
Collection
Publications
Institution
Title
Robust image alignment for cryogenic transmission electron microscopy.
Journal
Journal of structural biology
ISSN
1095-8657 (Electronic)
ISSN-L
1047-8477
Publication state
Published
Issued date
03/2017
Peer-reviewed
Oui
Volume
197
Number
3
Pages
279-293
Language
english
Notes
Publication types: Journal Article ; Research Support, Non-U.S. Gov't
Publication Status: ppublish
Publication Status: ppublish
Abstract
Cryo-electron microscopy recently experienced great improvements in structure resolution due to direct electron detectors with improved contrast and fast read-out leading to single electron counting. High frames rates enabled dose fractionation, where a long exposure is broken into a movie, permitting specimen drift to be registered and corrected. The typical approach for image registration, with high shot noise and low contrast, is multi-reference (MR) cross-correlation. Here we present the software package Zorro, which provides robust drift correction for dose fractionation by use of an intensity-normalized cross-correlation and logistic noise model to weight each cross-correlation in the MR model and filter each cross-correlation optimally. Frames are reliably registered by Zorro with low dose and defocus. Methods to evaluate performance are presented, by use of independently-evaluated even- and odd-frame stacks by trajectory comparison and Fourier ring correlation. Alignment of tiled sub-frames is also introduced, and demonstrated on an example dataset. Zorro source code is available at github.com/CINA/zorro.
Keywords
Cryoelectron Microscopy/methods, Microscopy, Electron, Transmission/methods, Models, Theoretical, Software, Cross correlation, Cryogenic transmission electron microscopy, Direct detection device, Dose fractionation, Image alignment, Image registration
Pubmed
Web of science
Create date
09/06/2023 15:02
Last modification date
08/07/2023 5:50