Robust image alignment for cryogenic transmission electron microscopy.

Détails

ID Serval
serval:BIB_9F9A3B9CBBBF
Type
Article: article d'un périodique ou d'un magazine.
Collection
Publications
Titre
Robust image alignment for cryogenic transmission electron microscopy.
Périodique
Journal of structural biology
Auteur⸱e⸱s
McLeod R.A., Kowal J., Ringler P., Stahlberg H.
ISSN
1095-8657 (Electronic)
ISSN-L
1047-8477
Statut éditorial
Publié
Date de publication
03/2017
Peer-reviewed
Oui
Volume
197
Numéro
3
Pages
279-293
Langue
anglais
Notes
Publication types: Journal Article ; Research Support, Non-U.S. Gov't
Publication Status: ppublish
Résumé
Cryo-electron microscopy recently experienced great improvements in structure resolution due to direct electron detectors with improved contrast and fast read-out leading to single electron counting. High frames rates enabled dose fractionation, where a long exposure is broken into a movie, permitting specimen drift to be registered and corrected. The typical approach for image registration, with high shot noise and low contrast, is multi-reference (MR) cross-correlation. Here we present the software package Zorro, which provides robust drift correction for dose fractionation by use of an intensity-normalized cross-correlation and logistic noise model to weight each cross-correlation in the MR model and filter each cross-correlation optimally. Frames are reliably registered by Zorro with low dose and defocus. Methods to evaluate performance are presented, by use of independently-evaluated even- and odd-frame stacks by trajectory comparison and Fourier ring correlation. Alignment of tiled sub-frames is also introduced, and demonstrated on an example dataset. Zorro source code is available at github.com/CINA/zorro.
Mots-clé
Cryoelectron Microscopy/methods, Microscopy, Electron, Transmission/methods, Models, Theoretical, Software, Cross correlation, Cryogenic transmission electron microscopy, Direct detection device, Dose fractionation, Image alignment, Image registration
Pubmed
Web of science
Création de la notice
09/06/2023 15:02
Dernière modification de la notice
08/07/2023 5:50
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