Beam damage to organic material is considerably reduced in cryo-electron microscopy

Details

Request a copyRequest a copy
Serval ID
serval:BIB_999E77802572
Type
Article: article from journal or magazin.
Collection
Publications
Institution
UNIL/CHUV
Title
Beam damage to organic material is considerably reduced in cryo-electron microscopy
Journal
Journal of Molecular Biology
Author(s)
Knapek  E., Dubochet  J.
ISSN
0022-2836 (Print)
Publication state
Published
Issued date
08/1980
Volume
141
Number
2
Pages
147-61
Notes
Journal Article --- Old month value: Aug 5
Keywords
Catalase/radiation effects Cold Electrons *Microscopy, Electron Radiation Dosage Valine/radiation effects
OAI-PMH
oai:serval.unil.ch:BIB_999E77802572
DOI
10.1016/0022-2836(80)90382-4
Pubmed
7441748
Web of science
A1980KC17300004
Create date
24/01/2008 11:25
Last modification date
20/08/2019 16:01
Usage data