Focused ion beam scanning electron microscopy in biology.

Détails

ID Serval
serval:BIB_86CED6A78D88
Type
Article: article d'un périodique ou d'un magazine.
Collection
Publications
Titre
Focused ion beam scanning electron microscopy in biology.
Périodique
Journal of Microscopy
Auteur(s)
Kizilyaprak C., Daraspe J., Humbel B.M.
ISSN
1365-2818 (Electronic)
ISSN-L
0022-2720
Statut éditorial
Publié
Date de publication
2014
Peer-reviewed
Oui
Volume
254
Numéro
3
Pages
109-114
Langue
anglais
Notes
Publication types: Journal Article Publication Status: ppublish
Résumé
Since the end of the last millennium, the focused ion beam scanning electron microscopy (FIB-SEM) has progressively found use in biological research. This instrument is a scanning electron microscope (SEM) with an attached gallium ion column and the 2 beams, electrons and ions (FIB) are focused on one coincident point. The main application is the acquisition of three-dimensional data, FIB-SEM tomography. With the ion beam, some nanometres of the surface are removed and the remaining block-face is imaged with the electron beam in a repetitive manner. The instrument can also be used to cut open biological structures to get access to internal structures or to prepare thin lamella for imaging by (cryo-) transmission electron microscopy. Here, we will present an overview of the development of FIB-SEM and discuss a few points about sample preparation and imaging.
Pubmed
Web of science
Création de la notice
27/08/2014 15:07
Dernière modification de la notice
03/03/2018 19:00
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