The mammalian central nervous synaptic cleft contains a high density of periodically organized complexes.

Details

Serval ID
serval:BIB_2254EF3F453F
Type
Article: article from journal or magazin.
Collection
Publications
Institution
Title
The mammalian central nervous synaptic cleft contains a high density of periodically organized complexes.
Journal
Proceedings of the National Academy of Sciences of the United States of America
Author(s)
Zuber B., Nikonenko I., Klauser P., Muller D., Dubochet J.
ISSN
0027-8424
Publication state
Published
Issued date
2005
Peer-reviewed
Oui
Volume
102
Number
52
Pages
19192-19197
Language
english
Notes
Journal Article Research Support, Non-U.S. Gov't --- Old month value: Dec 27
Abstract
Cryo-electron microscopy of vitreous section makes it possible to observe cells and tissues at high resolution in a close-to-native state. The specimen remains hydrated; chemical fixation and staining are fully avoided. There is minimal molecular aggregation and the density observed in the image corresponds to the density in the object. Accordingly, organotypic hippocampal rat slices were vitrified under high pressure and controlled cryoprotection conditions, cryosectioned at a final thickness of approximately 70 nm and observed below -170 degrees C in a transmission electron microscope. The general aspect of the tissue compares with previous electron microscopy observations. The detailed analysis of the synapse reveals that the density of material in the synaptic cleft is high, even higher than in the cytoplasm, and that it is organized in 8.2-nm periodic transcleft complexes. Previously undescribed structures of presynaptic and postsynaptic elements are also described.
Keywords
Animals, Biopsy, Central Nervous System, Cryoelectron Microscopy, Electrophysiology, Freezing, Hippocampus, Microscopy, Electron, Microscopy, Electron, Transmission, Nerve Tissue, Nervous System, Peripheral Nervous System, Pressure, Rats, Synapses, Temperature, Time Factors
Pubmed
Web of science
Open Access
Yes
Create date
24/01/2008 11:25
Last modification date
20/08/2019 13:59
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