Determination of DNA persistence length by cryo-electron microscopy. Separation of the static and dynamic contributions to the apparent persistence length of DNA.

Détails

ID Serval
serval:BIB_30F14CE66460
Type
Article: article d'un périodique ou d'un magazine.
Collection
Publications
Institution
Titre
Determination of DNA persistence length by cryo-electron microscopy. Separation of the static and dynamic contributions to the apparent persistence length of DNA.
Périodique
Journal of Molecular Biology
Auteur(s)
Bednar J., Furrer P., Katritch V., Stasiak A.Z., Dubochet J., Stasiak A.
ISSN
0022-2836[print], 0022-2836[linking]
Statut éditorial
Publié
Date de publication
12/1995
Volume
254
Numéro
4
Pages
579-594
Langue
anglais
Notes
Publication types: Journal Article ; Research Support, Non-U.S. Gov't Publication Status: ppublish
Résumé
Axial deflection of DNA molecules in solution results from thermal motion and intrinsic curvature related to the DNA sequence. In order to measure directly the contribution of thermal motion we constructed intrinsically straight DNA molecules and measured their persistence length by cryo-electron microscopy. The persistence length of such intrinsically straight DNA molecules suspended in thin layers of cryo-vitrified solutions is about 80 nm. In order to test our experimental approach, we measured the apparent persistence length of DNA molecules with natural "random" sequences. The result of about 45 nm is consistent with the generally accepted value of the apparent persistence length of natural DNA sequences. By comparing the apparent persistence length to intrinsically straight DNA with that of natural DNA, it is possible to determine both the dynamic and the static contributions to the apparent persistence length.
Mots-clé
Base Sequence, DNA/chemistry, Freezing, Image Processing, Computer-Assisted/methods, Microscopy, Electron/methods, Models, Chemical, Models, Molecular, Molecular Sequence Data, Monte Carlo Method, Nucleic Acid Conformation
Pubmed
Web of science
Création de la notice
24/01/2008 10:25
Dernière modification de la notice
20/08/2019 13:15
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