Surface Analysis by Secondary Ion Mass Spectrometry (SIMS): Principles and Applications from Swiss laboratories

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Ressource 1Download: Marin-Carbonne-Chimia2021.pdf (774.74 [Ko])
State: Public
Version: Final published version
License: CC BY 4.0
Serval ID
serval:BIB_BA425E5534BE
Type
Article: article from journal or magazin.
Collection
Publications
Institution
UNIL/CHUV
Title
Surface Analysis by Secondary Ion Mass Spectrometry (SIMS): Principles and Applications from Swiss laboratories
Journal
CHIMIA
Author(s)
Marin Carbonne Johanna, Bouvier Anne Sophie, Baumgartner Lukas, rubatto Daniela, Bovay Thomas, Plane Florent, Escrig Stephane, Kiss Andras
ISSN
2673-2424
0009-4293
Publication state
Published
Issued date
23/02/2022
Volume
76
Number
1-2
Pages
26
Keywords
General Medicine, General Chemistry
URN
urn:nbn:ch:serval-BIB_BA425E5534BE0
OAI-PMH
oai:serval.unil.ch:BIB_BA425E5534BE
DOI
10.2533/chimia.2022.26
Open Access
Yes
Create date
07/03/2022 21:20
Last modification date
08/03/2022 7:12
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