Beam damage to organic material is considerably reduced in cryo-electron microscopy
Details
Serval ID
serval:BIB_999E77802572
Type
Article: article from journal or magazin.
Collection
Publications
Institution
Title
Beam damage to organic material is considerably reduced in cryo-electron microscopy
Journal
Journal of Molecular Biology
ISSN
0022-2836 (Print)
Publication state
Published
Issued date
08/1980
Volume
141
Number
2
Pages
147-61
Notes
Journal Article --- Old month value: Aug 5
Keywords
Catalase/radiation effects
Cold
Electrons
*Microscopy, Electron
Radiation Dosage
Valine/radiation effects
Pubmed
Web of science
Create date
24/01/2008 10:25
Last modification date
20/08/2019 15:01