Empirical Evaluation of a Queueing Network Model for Semi Conductor Wafer Fabrication

Détails

ID Serval
serval:BIB_237D15C08D57
Type
Article: article d'un périodique ou d'un magazine.
Collection
Publications
Titre
Empirical Evaluation of a Queueing Network Model for Semi Conductor Wafer Fabrication
Périodique
Operations Research
Auteur(s)
van Ackere A., Chen H., Harrison J.M., Mandelbaum A., Wein L.M.
Statut éditorial
Publié
Date de publication
1988
Peer-reviewed
Oui
Volume
36
Numéro
2
Pages
202-215
Langue
anglais
Résumé
The congestion problems that plague wafer fabrication facilities are described in general terms, and several years' operating data from one particular facility are summarized. A simple queueing network model of that facility is constructed, and the model is used to predict certain key system performance measures. The values predicted by the model are found to be within about 10% of those actually observed. These results suggest that queueing network models can provide useful quantitative guidance to designers of wafer fabrication facilities, and we discuss refinements and extensions of our elementary model that are likely to be important in other settings. An important benefit gained from queueing theory is that congestion and delay in wafer fabrication are caused by variability in the operating environment.
Mots-clé
683 queueing applications, 697 queueing networks
Création de la notice
02/06/2009 15:48
Dernière modification de la notice
20/08/2019 14:01
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