High-resolution low-dose scanning transmission electron microscopy.
Détails
ID Serval
serval:BIB_08C2D4A2B060
Type
Article: article d'un périodique ou d'un magazine.
Collection
Publications
Institution
Titre
High-resolution low-dose scanning transmission electron microscopy.
Périodique
Journal of electron microscopy
ISSN
1477-9986 (Electronic)
ISSN-L
0022-0744
Statut éditorial
Publié
Date de publication
2010
Peer-reviewed
Oui
Volume
59
Numéro
2
Pages
103-112
Langue
anglais
Notes
Publication types: Journal Article ; Research Support, N.I.H., Extramural ; Research Support, U.S. Gov't, Non-P.H.S.
Publication Status: ppublish
Publication Status: ppublish
Résumé
During the past two decades instrumentation in scanning transmission electron microscopy (STEM) has pushed toward higher intensity electron probes to increase the signal-to-noise ratio of recorded images. While this is suitable for robust specimens, biological specimens require a much reduced electron dose for high-resolution imaging. We describe here protocols for low-dose STEM image recording with a conventional field-emission gun STEM, while maintaining the high-resolution capability of the instrument. Our findings show that a combination of reduced pixel dwell time and reduced gun current can achieve radiation doses comparable to low-dose TEM.
Mots-clé
Electrons, Image Processing, Computer-Assisted, Imaging, Three-Dimensional, Microscopy, Electron, Scanning Transmission/instrumentation, Microscopy, Electron, Scanning Transmission/methods, Microscopy, Electron, Transmission/instrumentation, Microscopy, Electron, Transmission/methods, Oxides/chemistry, Proteins/chemistry, Strontium/chemistry, Titanium/chemistry
Pubmed
Web of science
Création de la notice
09/06/2023 15:03
Dernière modification de la notice
28/07/2023 5:58