Low-dose aberration corrected cryo-electron microscopy of organic specimens.

Details

Serval ID
serval:BIB_BDD6FDD2C1C3
Type
Article: article from journal or magazin.
Collection
Publications
Title
Low-dose aberration corrected cryo-electron microscopy of organic specimens.
Journal
Ultramicroscopy
Author(s)
Evans J.E., Hetherington C., Kirkland A., Chang L.Y., Stahlberg H., Browning N.
ISSN
0304-3991 (Print)
ISSN-L
0304-3991
Publication state
Published
Issued date
11/2008
Peer-reviewed
Oui
Volume
108
Number
12
Pages
1636-1644
Language
english
Notes
Publication types: Journal Article ; Research Support, N.I.H., Extramural ; Research Support, Non-U.S. Gov't ; Research Support, U.S. Gov't, Non-P.H.S.
Publication Status: ppublish
Abstract
Spherical aberration (C(s)) correction in the transmission electron microscope has enabled sub-angstrom resolution imaging of inorganic materials. To achieve similar resolution for radiation-sensitive organic materials requires the microscope to be operated under hybrid conditions: low electron dose illumination of the specimen at liquid nitrogen temperature and low defocus values. Initial images from standard inorganic and organic test specimens have indicated that under these conditions C(s)-correction can provide a significant improvement in resolution (to less than 0.16nm) for direct imaging of organic samples.
Keywords
Cryoelectron Microscopy/methods, Microscopy, Electron, Transmission/methods
Pubmed
Web of science
Create date
09/06/2023 16:03
Last modification date
28/07/2023 6:59
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