Tomography of insulating biological and geological materials using focused ion beam (FIB) sectioning and low-kV BSE imaging.

Details

Serval ID
serval:BIB_B8D03BEF0F9B
Type
Article: article from journal or magazin.
Collection
Publications
Title
Tomography of insulating biological and geological materials using focused ion beam (FIB) sectioning and low-kV BSE imaging.
Journal
Journal of Microscopy
Author(s)
De Winter D.A.M , Schneijdenberg C.T.W.M., Lebbink M.N., Lich B., Verkleij A.J., Drury M.R., Humbel B.M.
ISSN
1365-2818 (Electronic)
ISSN-L
0022-2720
Publication state
Published
Issued date
2009
Volume
233
Number
3
Pages
372-383
Language
english
Abstract
Tomography in a focused ion beam (FIB) scanning electron microscope (SEM) is a powerful method for the characterization of three-dimensional micro- and nanostructures. Although this technique can be routinely applied to conducting materials, FIB-SEM tomography of many insulators, including biological, geological and ceramic samples, is often more difficult because of charging effects that disturb the serial sectioning using the ion beam or the imaging using the electron beam. Here, we show that automatic tomography of biological and geological samples can be achieved by serial sectioning with a focused ion beam and block-face imaging using low-kV backscattered electrons. In addition, a new ion milling geometry is used that reduces the effects of intensity gradients that are inherent in conventional geometry used for FIB-SEM tomography.
Keywords
Cells, Cultured, Endothelial Cells/ultrastructure, Endothelium, Vascular/cytology, Humans, Magnesium, Microscopy, Electron, Scanning/methods, Microtomy, Silicon Compounds/chemistry, Tissue Embedding/methods, Tissue Fixation/methods, Tomography/methods, Umbilical Cord/blood supply, Umbilical Cord/cytology
Pubmed
Create date
28/02/2012 19:09
Last modification date
20/08/2019 15:26
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